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DIS 025-SP1/E:2019 Test Method for OLED Luminaires and OLED Light Sources
DIS 017/E:2016 ILV: International Lighting Vocabulary 2nd Edition
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2019 Joint CIE NC Canada, CIE NC US with the Council for Optical Radiation Measurements (CORM)

 
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Second Junior Balkan Conference on Lighting "BalkanLightJunior 2019" and accompanying event "Lighting2019" - Plovdiv, Bulgaria

The National Committe for Lighting in Bulgaria (NCLB) is proud to announce their upcoming event ...
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CIE NC Russia - International Scientific and Technical Greenhouses Lighting Conference

  Registration for this event is now open to participants of the International Scientific and Technical...
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Illuminating Engineering Society - Annual Conference

 
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29th Session of the CIE - Individual Conference Papers Available

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CIE 233:2019 Calibration, Characterization and Use of Array Spectroradiometers

Array spectroradiometers are used pervasively in light measurement. However, their properties are not widely understood by users. This report seeks to educate users in the characteristics of array spectroradiometers that are... more

CIE 232:2019 Discomfort Caused by Glare from Luminaires with a Non-Uniform Source Luminance

In 1995 the CIE Technical Committee 3-13 developed the Unified Glare Rating (UGR) to predict discomfort glare for indoor lighting systems. For practical reasons, the UGR is based on the average source luminance. The introduction of... more

CIE 231:2019 CIE Classification System of Illuminance and Luminance Meters

The properties of illuminance meters and luminance meters are characterized by a number of selected quality indices defined in ISO/CIE 19476:2014 “Characterization of the Performance of Illuminance Meters and Luminance Meters”,... more

ISO/CIE 17166:2019(E) Erythema reference action spectrum and standard erythema dose

This document was prepared by the International Commission on Illumination (CIE) in cooperation with Technical Committee ISO/TC 274, Light and lighting. This first edition of ISO/CIE 17166 cancels and replaces ISO 17166:1999 | CIE S... more

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