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CIE 2017 Midterm Meeting, Jeju Island, Republic of Korea. October 20 - 28, 2017 

Draft Conference and TC meeting programmes now available

CIE 2018 Topical Conference on Smart Lighting, Taipei, Chinese Taipei, April 24 – 28, 2018
Abstract Submission Open




Optical Measurement of High-Power LEDs

CIE 225:2017    


ISBN 978-3-902842-12-1
DOI: 10.25039/TR.225.2017


Measurement results for light emitting diodes (LEDs) strongly depend on their thermal conditions. In order to achieve reproducible results with small uncertainties it is critical to accurately set and control the junction temperature of an LED during the time of optical measurement. This technical report describes the methods and procedures for measurement of high-power LEDs (HP-LEDs) under DC operation to acquire photometric, radiometric, and colorimetric quantities at a specified junction temperature.
The publication is written in English, with a short summary in French and German. It consists of 46 pages with 15 figures and is readily available from the CIE Webshop or from the National Committees of the CIE.

The following members of TC 2-63 “Optical Measurement of High-Power LEDs” took part in the preparation of this Technical Report. The committee comes under Division 2 “Physical Measurement of Light and Radiation”.

Authors:

  • Zong, Y. (Chair)    USA
  • Chou, P.    Chinese Taipei
  • Dekker, P.    Netherlands
  • Distl, R.    Germany
  • Godo, K.    Japan
  • Hanselaer, P.    Belgium
  • Heidel, G.    Germany
  • Hulett, J.    USA
  • Oshima, K.    Japan
  • Poppe, A.    Hungary
  • Sauter, G.    Germany
  • Schneider, M.    Germany
  • Shen, H.    China
  • Sisto, M.M.    Canada
  • Sperling, A.    Germany
  • Young, R.    Germany
  • Zhao, W.    China

Advisors:

  • Cariou, N.    France
  • Csuti, P.    Hungary
  • Hua, S.    China
  • Kang, J.    South Korea
  • Kohmoto, K.    Japan
  • Lou, N.    USA
  • Mou, T.    China
  • Muray, K.    USA
  • Naegele, T.    Germany
  • Ohno, Y.    USA
  • Pan, J.    China
  • Schakel, M.    Netherlands
  • Venkataramanan, V.    Canada
  • Wagner, N.    Germany
  • Zhu, S.    USA


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