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CIE 2017 Midterm Meeting, Jeju Island, Republic of Korea. October 20 - 28, 2017 


CIE Tutorial and Practical Workshop on LED Lamp and Luminaire Testing to CIE S 025, Bern-Wabern, Switzerland.


CIE Expert Workshop on Advanced Methods for Photometry

October 8-9, 2013, Bled, Slovenia
CIE Division 2 Technical Committee Meetings
October 7, 2013, Bled, Slovenia
Topics:
Measurement Uncertainty in Photometric Testing of SSL products
Sampling Theory in Photometry and Spectroradiometry
Synopsis
The International Commission on Illumination (CIE) offers a two-day workshop on state-of-the-art techniques in the field of photometry. Invited experts will present lectures frmo basic concepts to advanced techniques in photometric and colorimetric measurements, aimed at engineers and researchers in LED and solid state lighting measurement and other fields. The event is organised by CIE Division 2 in cooperation with the Lighting Engineering Society of Slovenia (SDR). Some Technical Committees meetings will also be organized. The workshop will be followed by the annual international Lighting conference Razsvetljava 2013 (http://www.sdr.si/sl/102).

Who Should Attend
This meeting is open to everyone with an interest in any aspect of optical radiation measurements – photometry, colorimetry, and radiometry. 

Venue
The workshop and Division 2 meetings will be held at Hotel Park, Bled, Slovenia. The local transportation information is available at website, www.sdr.si/sl/div2.html

Registration
On-line registration form and hotel information are available at: www.sdr.si/sl/div2.html

Symposium Secretariat
Office SDR  E-mail: matej.kobav@fe.uni-lj.si Tel: +386 1 47 68 759

Scientific Committee:
Peter Blattner,  Armin Sperling, Joanne Zwinkels, Guy Vandermeersch, Hiroshi Shitomi, Tony Bergen, Jim Gardner, Yoshihiro Ohno, Teresa Goodman, Grega Bizjak (SDR)

Symposium Co-Chairs
Peter Blattner
Federal Office of Metrology (METAS), Bern-Wabern, Switzerland
E-mail: peter.blattner@metas.ch Tel: + 41 (0)58 387 03 40

Grega Bizjak
University of Ljubljana, Faculty of Electrical Engineering, Ljubljana, Slovenia
E-mail: grega.bizjak@fe.uni-lj.si Tel: +386 (0)1 47 68 446

Workshop fee 
Early bird registration
(before September 20, 2013
350 EUR
Normal registration
(after September 20, 2013)
400 EUR
TC meetings 50 EUR

Accompanying persons program 
Accompanying persons program will be organised during the workshop and conference and there will also be guided tours after the workshop.

 

TC meeting program
Sunday 6.10.2013
18:30 - ∞ TC2-77 Tony Bergen Fundamental Concepts
Monday 7.10.2013
09:00 - 10:30 TC2-51 Richard Young Calibration, Characterisation and Use of Array Spectroradiometers
10:30 - 10:45 Coffee break
10:45 - 11:15 TC2-60 Jim Gardner Effect of Instrumental Bandpass Function and Measurement Interval on Spectral Quantities
11:15 - 12:45 TC2-68 Thorsten Gerloff Optical Measurement Methods for OLEDs used for Lighting
12:45 - 13:45 Lunch break
13:45 - 15:00 TC2-72 Richard Young The Evaluation of Uncertainties in Measurement of the Optical Properties of Solid State Lighting Devices, including Coloured LEDs
15:00 - 15:30 TC2-78 Tony Bergen The Goniophotometry of Lamps and Luminaires
15:30 - 15:45 Coffee break
15:45 - 17:00 TC2-74 Jiangen Pan Goniospectroradiometry of Optical Radiation Sources
17:00 - 18:30 TC2-71 TG Yoshi Ohno Task Group to draft a Technical Note for the CIE Standard on Test Methods for LED Lamps, Luminaires and Modules

 

Workshop program (preliminary version)

Tuesday, October 8, 2013
09:00 - 09:15 15' Opening
09:15 - 10:00 45' General aspects of an MU Budget (Modelling, correlations, integrated quantities (one and more results) (GUM, S1, S2) Armin Sperling
10:00 - 10:45 45' MU in testing (GUM S 6) Peter Blattner
10:45 - 11:15 30' Coffee break
11:15 - 12:30 75' MU in Integrating Spherephotometry & Goniophotometer Tony Bergen
12:30 - 13:30 60' Lunch break
13:30 - 14:45 75' MU of spectral quantities, including spectral correlation Jim Gardner
14:45 - 15:15 30' Practical approach to MU of colour quantities of light sources Yoshi Ohno
15:15 - 15:45 30' Coffee break
15:45 -16:15 30' MU in imaging photometry Udo Krüger
16:15 -17:00 45' MU on electrical quantities  
Wednesday, October 9, 2013
09:15 - 09:45 30' Practical implementation of MU in industry David Chan
09:45 - 10:15 30' Presentation of TC2-51 work Richard Young
10:15 - 10:45 30' Presentation of TC2-60 work Jim Gardner
10:45 - 11:15 30' Coffee break
11:15 - 11:45 30' Combining asymmetric probability distributions of systematic error components Yoshi Ohno
11:45 - 12:15 30' Lifetime testing of SSL products David Chan
12:15 - 12:45 30' Results of the EMRP project on SSL metrology  
12:45 - 13:45 60' Lunch break
13:45 - 14:45 60' Sampling theory (part 1) Andrej Levstek
14:45 - 15:15 30' Coffee break
15:15 - 16:00 45' Sampling theory (part 2) Andrej Levstek
16:00 - 16:45 45' Sampling theory applied to spectral measurements Udo Krüger
16:45 - 17:00 15' Discussion


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