Call for participation

 

2nd CIE EXPERT SYMPOSIUM on

LED MEASUREMENT

 

Standard methods for specifying and

measuring LED and LED Cluster characteristics

 

10 - 12 May 2001

Holiday Inn, Gaithersburg, Maryland

USA

2nd Circular

Background

The first CIE Expert Symposium on LED measurement was held at the CIE Central Bureau in Vienna in 1997. During the past four years LEDs observed a considerable progress. Both as individual lamps and as clusters for signalling and recently even for lighting purposes LEDs have become competitive with more traditional light sources. Currently there are considerable efforts within the LED industry and the community who use LEDs to standardise on LED characterisation and measurement. Several CIE Technical Committees are active in the field.

The Goals

The goals of the meeting are:

• Characterisation of LEDs and the measurement of individual LEDs,
• Measurement of LED clusters and arrays,
• Other aspects of LED measurements, including safety issues.

Who Should Attend

This meeting is open to all participants. To insure adequate space and support, and to allow distribution and adequate review of relevant documents, prior registration is required. The following individuals are specifically encouraged to attend:

• Quality control laboratory personnel at LED manufacturers and users.
• Those responsible in specifying and testing LED properties.
• Those working in research laboratories dealing with new LEDs and LED-clusters.

Venue

Gaithersburg, Maryland, is in the suburbs of Washington DC, where National Institute of Standards and Technology (NIST) is located. For hotel and transportation information, see the Symposium website:
http://physics.nist.gov/LED2001

or contact the Co-chair, Yoshi Ohno, E-mail: ohno@nist.gov, Tel: +1 301 975-2321

TUTORIAL SESSION

10 May 2001

Yoshi Ohno: Introduction to photometry and radiometry of LEDs

Teresa Goodman: Introduction to spectroradiometry and colorimetry of LEDs

Georg Sauter: Uncertainty principles and their application to LED measurement

Kathleen Muray: CIE work on LED measurement

János Schanda: Visual aspects connected with LED measurement

SYMPOSIUM

11 & 12 May 2001

Invited Papers

CK Andersen: Considerations in the use of LED clusters for transportation signalling

G Heidel: Measurement problems in LED production

S Jenkins: Use of LED clusters for signals and their measurement

S Johnson: State of the art of OLED technologies

K Kohmoto: Development of white LEDs in Japan

G Mueller: State of the art of LED technologies (Keynote paper)

DH Sliney and BE Stuck: The potential ocular hazards of LED emitters

R Young: LED measurement instrumentation

Contributed Papers

W Horak et al: Comparative optical radiation safety analysis of new LED-devices and -lamps

B Kránicz and Y Ohno: Deconvolution for spectral data of LEDs

C Lányi et al: Introducing a CD-ROM on LEDs

WJ Marshall: Laser source size as a function of distance

CC Miller and Y Ohno: Luminous intensity measurements of light emitting diodes at NIST

CC Miller and Y Ohno: Luminous flux calibration of LEDs at NIST

K Muray et al: Comparison measurements of LEDs: Spectral power distribution

T Nägele: Problems and requirements of the optical characterization of LEDs

Y Ohno and B Kránicz: Spectroradiometer characterization for colorimetry of LEDs

J Schanda et al: Light emitting diode standards

K Suzuki et al: Round robin LED photometry test in Japan

T Tarczali et al: Colour rendering properties of LED sources

R Young et al: Quantifying photometric spectral mismatch uncertainties in LED measurements

Registration

• LED measurement tutorials, 10 May 2001.Several CIE publications and lecture notes will serve as background material for the tutorials.
  Registration fee: US$ 400,-
  
• LED Symposium, 11-12 May 2001.
  Registration fee: US$ 250,-
  

  For participants of both parts a reduced registration fee of US$ 500,- holds.
  

Deadline for registration is 15 April 2001. Payment to be sent to the CIE Central Bureau Bank Account:

04610-665-450 at BAWAG Landstraßer Hauptstraße 60, A-1030 Wien, Austria.

VISA, Master Card, American Express credit card also honoured.

The Symposium will be followed by meetings of CORM and CIE Div. 2:

 

May 13 pm: CORM/CIE social event at Smithsonian National Gallery of Art

(CIE LED Symposium pariticpants are invited to this event, but an advance registration is required.Please submit the CORM2001 registration form as instructed. The number of tickets are limited and are available on the first-come first-served basis only. )

May 14: CORM subcommittee and CIE TC meetings at NIST (open to nonmembers as guests)

May 15 to 16: CORM2001, with NIST laboratory tour on May 16 pm (open to CORM and CIE participants)

May 17 to 19 CIE Div. 2 and TC meetings at NIST and Holiday Inn Gaithersburg

 

 

Final Registration

 

Please return this registration form for final registration to CIE Central Bureau by

 

Fax: +43 1 713 08 38 18

Mail: CIE, Kegelgasse 27,A-1030 Wien, AUSTRIA

e-mail: ciecb@ping.at  (Fax / mail is recommended for credit card information)

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[  ] CIE LED tutorial Workshop 2001

[  ] 2nd CIE LED Symposium 2001

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