TUTORIAL, Thursday, May 10, 2001
Yoshi Ohno (NIST, USA): Introduction to photometry and radiometry of LEDs
Teresa Goodman (NPL, UK): Introduction to spectroradiometry and colorimetry of LEDs
Georg Sauter (PTB, Germany): Uncertainty principles and their application to LED measurement
Kathleen Muray (INPHORA Inc. USA): CIE work on LED measurement
János Schanda (Univ. Veszprém, Hungary): Visual aspects connected with LED measurement
SYMPOSIUM, Friday, May 11-12, 2001
Gerd O. Mueller (LumiLeds, USA)
State
of the Art of LED Technologies (Keynote
paper)
Steve Johnson (Lawrence Berkeley National
Laboratory, USA):
The
Emergence of Organic Light Emitting Diodes (OLEDs) as a Future Solid
State Light Source (invited
paper)
Thomas Nägele (Instrument Systems GmbH,
Germany)
Problems and
Requirements of the Optical Characterization of LEDs
Richard L. Austin and Charles R. Lustenberger
(Gamma Scientific, USA)
Intercomparison
of Spectroradiometric and Photometric Measurements of Light Emitting
Diode Luminous Intensity
Ken'ichi Suzuki (Matsushita Electronics
Corporation, Japan), et al
Round
Robin LED Photometry Test in Japan
Richard Young (Optronic Laboratories, Inc.,
USA)
LED
Measurement Instrumentation (invited
paper)
J Schanda (University of Veszprém,
Hungary), G Schanda (Tenzi KFT, Hungary) and K Muray (INPHORA,
USA)
Light
Emitting Diode Standards
C. Cameron Miller and Yoshi Ohno (NIST,
USA)
Luminous
Intensity Measurements of Light Emitting Diodes at
NIST
Günther Heidel (OSRAM, Germany)
Measurement Problems in LED Production (invited paper)
Richard Young (Optronic Laboratories, USA),
Kathleen Muray (INPHORA, USA), Carolyn Jones (CJ Enterprises,
USA)
Quantifying
Photometric Spectral Mismatch Uncertainties in LED
Measurements
C. Cameron Miller and Yoshi Ohno (NIST,
USA):
Luminous
Flux Calibration of LEDs at NIST
Kotaro Kohmoto (Japan Electric Lamp
Manufacturers Association, Japan):
Development
of White LEDs in Japan (invited
paper)
Kathleen Muray (INPHORA, USA), Yoshi Ohno
(NIST, USA), János Schanda and Balázs Kránicz
(University of Veszprém, Hungary):
Comparison
Measurements of LEDs: Spectral power distribution
Yoshi Ohno (NIST, USA) and Balázs
Kránicz (University of Veszprém, Hungary):
Spectroradiometer
Characterization for Colorimetry of LEDs
Balázs Kránicz (University of
Veszprém, Hungary) and Yoshi Ohno (NIST, USA):
Deconvolution
for Spectral Data of LEDs
Tünde Tarczali, Péter Bodrogi and
János Schanda (University of Veszprém, Hungary):
Colour
Rendering Properties of LED Sources
Carl K. Andersen (U.S. Federal Highway
Administration):
On
the Use of Clusters of Light Emitting Diodes (LEDs) in Transportation
Signaling lights (invited
paper)
Steve E Jenkins (Optical and Photometric
Technology, Australia)
Use
of LED clusters for signals and their measurement
(invited paper)
David H. Sliney (US Army Center for Health
Promotion and Preventive Medicine) and Bruce E. Stuck (USAMRD-WRAIR,
USA)
The
Potential Ocular Hazards of LED Emitters
(invited paper)
Wesley J Marshall (USACHPPM):
Laser
Source Size as a Function of Distance
Werner Horak and Ronald Neuhaus (Siemens AG,
Germany):
Comparative
Optical Radiation Safety Analysis of new LED- Devices and
-Lamps
C Lányi, J Szabó, P Csuti, A
Pál, and J Schanda (University of Veszprém,
Hungary)
Introducing a
CD-ROM on LEDs