COMMISSION INTERNATIONALE DE L'ECLAIRAGE
INTERNATIONAL COMMISSION ON ILLUMINATION
INTERNATIONALE BELEUCHTUNGSKOMMISSION

Division 2: Physical Measurement of Light and Radiation

2007 CIE Division 2 / TC meetings
9-11 July 2007, Beijing, China
Update: June 26, 2007
 

Meeting venue: Beijing International Convention Center (BICC)  

 
July 2-4: Board meetings, General Assembly (not open to public)
July 5-7 (Thu - Sat): The 26th Session of the CIE
July 8 (Sun): City Day tour

July 9-10 (Mon-Tue): Division 2 TC meetings

July 11(Wed): Division 2 General Meeting

Other Divisions' TC meetings (pdf) .... this still may not be final.
 
July 12 (Thu) (AM): Lab tour of National Institute of Metrology (NIM) Division of Optics, Beijing, China
(those interested, contact Dr. Lin Yandong at   linyd@nim.ac.cn and ohno@nist.gov)
 
Division 2 TC Meetings Schedule
 
July 9 (Mon)

8:30 - 10:15
10:30 - 12:15

Lunch
13:30 - 15:15
15:30 - 17:15

Room 308
TC2-48
(Eppeldauer)
TC2-40
(Blattner)

 
TC2-49
(Ohno)
 TC2-47
(Sperling)
Room 309
  TC2-52
(Vandermeersch)

 
 TC2-56
(Miller)  
July 10 (Tue)

8:30 - 10:15
10:30 - 12:15

Lunch
13:30 - 15:15
15:30 - 17:15
17:15 - 18:30
Room 308
TC2-58
(Kohmoto)
TC2-50
(Schuette)

 
R2-36
(Heidel)
 TC2-51
(Austin)
 TC2-59
Blattner)
Room 309
 

 TC2-53
(Roesler)
 

July 11 (Wed)

9:00 - 12:15

Lunch
13:30 - 16:00
 16:00 - 17:00

Room 201A

     D2 General Meeting
Closing (Rm. 305)
 
TC2-40 Characterising the performance of illuminance and luminance meters (Blattner)
TC2-47 Characterization and Calibration Methods of UV Radiometers (Sperling)
TC2-48 Spectral responsivity measurement of detectors, radiometers, and photometers (Eppeldauer)
TC2-49 Photometry of Flashing Light (Ohno)
TC2-50 Measurement of the optical properties of LED clusters and arrays (Schuette)
TC2-51 Calibration of multi-channel spectrometers (Austin)
TC2-52 Addendum to CIE 121-1996 for the Photometry of Emergency Lighting Luminaires (Vandermeersch)
TC2-53 Multi-Geometry Color Measurements of Gonio-apparent Materials and Metrics for Evaluation (Roesler)
TC2-56 (S) CIE/ISO standard on retroreflection measurements (Miller)
TC2-58 Measurement of LED radiance and luminance (Kohmoto)
TC2-59 Characterisation of Imaging Luminance Measurement Devices ( Blattner)
R2-36 Measurement requirements for solid state light sources (Heidel)